automated crystal orientation mapping

**ACOM-TEM** (Automated Crystal Orientation Mapping) is a **TEM technique that automatically determines the crystal orientation at each point by matching experimental diffraction patterns to simulated templates** — producing orientation maps with nanometer spatial resolution. **How Does ACOM Work?** - **Scan**: Raster a nanoprobe across the sample, recording a diffraction pattern at each point. - **Templates**: Pre-compute simulated diffraction patterns for all possible orientations of the expected phases. - **Match**: Cross-correlate each experimental pattern with all templates to find the best match. - **Map**: Plot the orientation (as inverse pole figure colors) at each point. **Why It Matters** - **TEM Resolution**: Orientation mapping with ~2-5 nm spatial resolution (vs. ~50 nm for EBSD). - **Thin Films**: Works on TEM foils — critical for studying nanocrystalline and thin-film materials. - **Phase + Orientation**: Simultaneously identifies both the crystal phase and its orientation. **ACOM-TEM** is **EBSD for the TEM** — automated crystal orientation mapping at nanometer resolution using template matching of diffraction patterns.