object detection on wafers

**Object Detection on Wafers** is the **application of object detection algorithms to locate and classify multiple defects or features in a single wafer image** — predicting both the bounding box and class label for each defect, enabling rapid defect localization and categorization. **Key Object Detection Architectures** - **YOLO (You Only Look Once)**: Single-pass detection for real-time performance. - **Faster R-CNN**: Two-stage detector with region proposal + classification for higher accuracy. - **SSD (Single Shot Detector)**: Multi-scale feature map detection balancing speed and accuracy. - **Anchor-Free**: FCOS, CenterNet — predict defect centers without predefined anchor boxes. **Why It Matters** - **Multi-Defect**: Detects and classifies all defects in one image simultaneously (unlike image classification which handles one per crop). - **Localization**: Provides spatial coordinates for each defect — enables map generation. - **Production Speed**: YOLO-based detectors achieve real-time performance for inline inspection. **Object Detection** is **find, locate, and classify in one step** — applying modern detection architectures to simultaneously locate and categorize every defect in wafer images.