Semi E107

SEMI E107 defines a standardized data format for electrical-test failure data destined for yield-management systems — the structure that lets a prober or tester (reporting results through E91's PSEM) hand off per-die electrical failure data in a form a yield-management system can ingest consistently, regardless of which test-equipment vendor generated it. E91's PSEM standardizes how a prober communicates its states and per-die pass/fail events to a host, but "pass/fail" alone doesn't tell a yield-management system *why* a die failed — E107 is the format that carries the richer failure-mode detail (which test, which bin, which parametric limit was violated) in a structure consistent enough to feed automated yield analysis across a fleet of mixed-vendor test equipment.

Die fails electrical test on a prober/tester
E91's PSEM already reports the pass/fail event itself
SEMI E107 — electrical-failure data formatCarries the why, not just the pass/fail
Failure mode, bin code, parametric limit violated
Standardized structure, consistent across test-equipment vendors
Tied to die coordinate and wafer map context
Links back to E91's per-die location data
Yield-management system ingests failure data automatically
No custom parsing per tester vendor to run yield analysis

The reason yield management needs this richer failure format rather than just the pass/fail bit is that root-cause analysis depends entirely on knowing which specific test and limit a die violated — a yield engineer correlating a defect pattern back to a process step needs to know "failed on parametric test X, bin code Y," not just "failed," and if every test-equipment vendor encodes that detail differently, a yield-management system either loses the detail entirely or needs custom parsing logic per vendor before it can run any meaningful correlation. E107 standardizes that failure-mode detail the same way other `.1`-style protocol specs standardize their own parent data, giving yield-management systems a consistent structure to ingest regardless of whether the failing die came off a prober from one test-equipment vendor or another.

SEMI E107 — Pass/Fail Isn't Enough for Root Cause a yield engineer needs the failure mode, not just a bit E91 PSEM alone Reports: die at (x,y) = Fail No root-cause detail available With E107 failure format Die at (x,y) = Fail, bin 7, parametric limit on Vt test Enables real root-cause correlation Same structure, every test-equipment vendor no custom parsing before yield analysis can run

E107 is what turns a prober's standardized pass/fail stream into something a yield-management system can actually act on — it's the layer that carries root-cause detail across the same mixed-vendor fleet that E91's PSEM already standardized for location and basic status.

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