Home Knowledge Base Backside Illumination (BSI) Image Sensors

Backside Illumination (BSI) Image Sensors are the CMOS image sensor architecture where light enters from the back of the silicon wafer (opposite the metal wiring) — eliminating the optical obstruction caused by metal interconnect layers above the photodiodes, increasing quantum efficiency by 30-90% compared to front-side illumination (FSI), and enabling smaller pixel sizes (down to 0.56 µm pitch) that are essential for the high-resolution cameras in modern smartphones, automotive, and surveillance systems.

FSI vs. BSI Architecture

Front-Side Illumination (FSI):         Backside Illumination (BSI):
  Light ↓                                Light ↓
  [Micro-lens]                           [Micro-lens]
  [Color filter]                         [Color filter]
  ┌─────────────────────┐               ┌─────────────────────┐
  │ Metal 3             │               │ Photodiode (silicon) │ ← Light hits
  │ Metal 2             │ ← Light       │ Thin silicon (~3 µm) │    directly
  │ Metal 1             │    must pass  └─────────────────────┘
  │ Photodiode (silicon)│    through    │ Metal 1              │
  └─────────────────────┘    wiring     │ Metal 2              │
                                        │ Metal 3              │
                                        │ Carrier wafer        │
                                        └─────────────────────┘

FSI: Light blocked/scattered by metal → low QE at small pixels
BSI: Light hits photodiode directly → high QE regardless of pixel size

BSI Performance Advantage

MetricFSIBSIImprovement
Quantum efficiency (green)40-55%70-85%+50-90%
Quantum efficiency (blue)25-40%60-80%+100-140%
Angular responsePoor at edgesUniformSignificant
Minimum pixel pitch~1.4 µm0.56 µmMuch smaller
CrosstalkMediumLow (with DTI)Better color

BSI Fabrication Process

Step 1: Standard CMOS process on bulk wafer (front-side)
  - Photodiodes, transfer gates, readout transistors
  - Full BEOL metal stack (M1-M5+)

Step 2: Wafer bonding
  - Bond CMOS wafer (face-down) to carrier wafer or logic wafer
  - Oxide-oxide or hybrid bonding

Step 3: Wafer thinning
  - Grind and CMP the original substrate
  - Thin silicon to ~3-5 µm (need photodiode but not more)

Step 4: Backside processing
  - Anti-reflection coating (ARC)
  - Color filter array (Bayer pattern RGB)
  - Micro-lens array (one lens per pixel)
  - Deep trench isolation (DTI) between pixels

Step 5: Backside pad opening and interconnect
  - TSV or bond pad connections to front-side circuits

Key Technologies in Modern BSI Sensors

TechnologyWhat It DoesImpact
Deep Trench Isolation (DTI)Oxide-filled trench between pixelsPrevents optical/electrical crosstalk
Stacked BSIPixel array wafer bonded to logic waferPixel + CPU in one package
2-layer stackedPixel + ISP logicFaster readout, HDR
3-layer stackedPixel + DRAM + logicGlobal shutter, extreme speed
Phase detection AFSplit photodiodes for autofocusDSLR-like AF in phones

Pixel Size Evolution

YearPixel PitchResolution (phone)Sensor
20101.75 µm5 MPFSI
20151.12 µm13 MPBSI
20200.8 µm48-108 MPBSI stacked
20230.56 µm200 MPBSI stacked + DTI

Major Manufacturers

CompanyMarket Share (2024)Key Products
Sony~45%IMX series (iPhone, Sony cameras)
Samsung~25%ISOCELL (Galaxy, HP2)
OmniVision~10%OV series (automotive, security)
ON Semiconductor~8%Automotive image sensors

BSI image sensors are the enabling technology behind the smartphone camera revolution — by solving the fundamental optical limitation of front-side illumination where metal wiring blocked light from reaching photodiodes, BSI architecture made sub-micron pixels practical, enabling 200-megapixel sensors in devices thin enough to fit in a pocket while capturing images that rival dedicated cameras.

backside illumination sensorbsi image sensorcmos image sensorbsi processimage sensor fabrication

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