Scanning acoustic microscopy (SAM) is a non-destructive failure-analysis method that uses focused ultrasound to reveal internal defects in packaged parts and assembled structures. It is especially useful when a package or die attach has hidden voids, delamination, cracks, or poor bonding that are not visible from the surface. The core value of SAM is that it can inspect the inside of a sample without cutting it open.

The method works by sending acoustic energy through the sample and analyzing the reflected signal. Variations in material density, interface quality, or internal geometry change how the sound travels and how the echo comes back. That makes SAM very effective for detecting voids, disbonds, moisture pockets, package cracks, and other hidden structural defects.

SAM is widely used in packaging analysis, reliability screening, and failure isolation. It is often a fast first-pass tool when a team suspects a package-level issue but needs a non-destructive way to confirm it. In practice, the result is usually interpreted alongside X-ray, cross-sectioning, and electrical test data.

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In practice, scanning acoustic microscopy is a powerful non-destructive way to look inside a packaged device and identify hidden reliability issues before destructive analysis is needed.