Atmospheric-Pressure CVD
APCVD, LPCVD, and SACVD are the same basic chemical vapor deposition reaction — gas-phase precursors reacting and depositing a solid film — run at three different chamber pressures, and that pressure choice is what actually sets the film's uniformity, conformality, and throughput tradeoffs. Atmospheric-pressure CVD runs near 1 atm, low-pressure CVD runs at a few torr, and sub-atmospheric CVD sits deliberately between the two.
Lower pressure trades deposition rate for a fundamentally different, better-behaved growth mechanism. At atmospheric pressure, precursor molecules collide and react with each other in the gas phase before they even reach the wafer, which makes the deposition rate sensitive to small gas-flow and temperature variations across the chamber — hard to keep perfectly uniform. Dropping pressure increases the mean free path enough that gas-phase reactions become rare and the deposition becomes surface-reaction-limited instead — governed by chemistry happening right at the wafer surface, which is inherently easier to make uniform across a whole wafer or an entire furnace load of them.
LPCVD's throughput disadvantage is largely offset by running in batch furnaces rather than single-wafer tools. A single LPCVD wafer deposits slowly compared to APCVD, but LPCVD reactors are typically batch furnaces processing 25, 50, or more wafers simultaneously, so the effective wafers-per-hour throughput can actually compete with faster single-wafer regimes — this batch-processing compatibility is itself a direct consequence of LPCVD's lower pressure, which keeps the deposition uniform even across many wafers stacked close together in the same furnace tube.
APCVD, SACVD, and LPCVD aren't competing technologies so much as three points on the same pressure dial, and the right choice depends on whether a process needs APCVD's speed, LPCVD's uniformity and batch compatibility, or SACVD's attempt to get a useful amount of both.