Wafer Dicing Saw
A wafer dicing saw separates individual dies from a finished wafer using a physically rotating diamond blade, the original and still most common dicing method — distinct from the laser-stealth and plasma dicing methods covered elsewhere, which exist specifically to solve problems mechanical sawing runs into on thin or fragile wafers.
Mechanical sawing remains the default dicing method precisely because it's fast, well-understood, and inexpensive compared to the laser and plasma alternatives — it only loses out where the wafer itself can't tolerate the mechanical and thermal stress a spinning blade introduces. A diamond blade cutting through silicon generates real mechanical stress and some heat at the cut edge, which a standard-thickness wafer handles without issue; the laser-stealth and plasma dicing methods exist specifically for thin wafers, fragile low-k dielectric stacks, or extremely narrow dicing streets where that mechanical stress would cause unacceptable chipping or cracking — for everything else, mechanical sawing's speed and cost advantage keeps it the standard choice.
Blade selection and cut parameters are tuned to the specific wafer material and the dicing street's dimensions, since the wrong blade can chip the exact die edges the whole process is supposed to preserve cleanly. Diamond blade grit size, bond material, and cutting speed all affect the quality of the resulting die edge; too aggressive a cut can leave chipping or cracking right at the die edge that compromises the finished die's strength, which is why dicing saw process parameters get qualified specifically for each wafer type and street width rather than treated as a one-size-fits-all setting.
The mechanical dicing saw remains the workhorse singulation method across most of the industry precisely because it does its job quickly and cheaply for the vast majority of wafers — laser-stealth and plasma dicing exist as the specific answer for the thinner, more fragile cases where a spinning blade's mechanical stress becomes the limiting factor instead.