Step and Scan

Step-and-repeat and step-and-scan are the two fundamentally different ways a lithography tool images a reticle's pattern across a wafer, and the difference between them is exactly what separates an older "stepper" from a modern "scanner." A step-and-repeat tool flashes the entire reticle field onto the wafer in one static exposure, then steps the wafer to the next field position and flashes again; a step-and-scan tool instead sweeps a narrow slit of illumination across the reticle while the wafer stage moves in perfect synchrony beneath it, building up a full field one thin strip at a time before stepping to the next position — same end goal, completely different physics inside the tool.

Reticle loaded, field position set
same starting point either way
Two exposure strategies
Step-and-repeat
whole field flashed statically
Step-and-scan
narrow slit scanned synchronously
Wafer stage steps to next field
repeat across the whole wafer

The reason scanning won out is a lens-design problem, not a speed problem. A projection lens that stays perfectly corrected for aberrations across a full, large static field is extraordinarily hard and expensive to build, but a lens only has to be well-corrected across a narrow slit at any given instant if the wafer and reticle stages are scanning that slit across the field together — this is what let step-and-scan tools image a field roughly 26 by 33 millimeters, noticeably larger than step-and-repeat's practical limit around 22 by 22 millimeters, while using a comparably sized, comparably correctable lens.

Flash the Field vs. Scan a Slit same field, two very different stage motions step-and-repeat entire field flashed at once whole lens must correct the full field step-and-scan slit scans across lens only corrects a narrow slit at any instant a well-corrected slit is far easier to build than a well-corrected full field — that's the entire reason to scan

Scanning also forces a mechanical engineering problem that flashing never had: two stages moving in lockstep. The wafer stage has to track the reticle stage's scan motion at precisely the reduction ratio the optics use — a 4x reduction system means the wafer moves at exactly one-quarter the reticle's velocity, continuously, with nanometer-level synchronization error or the pattern smears — so a scanner's wafer and reticle stages are themselves a precision instrument in their own right, not just a conveyor that stops and starts between flashes the way a step-and-repeat tool's stage can get away with being.

ASML built its business on winning exactly this transition. GCA shipped the first commercial wafer stepper, the Mark II, in 1978 as a pure step-and-repeat tool, and the stepper market that followed was dominated by step-and-repeat machines through the 1980s; ASML's step-and-scan architecture, introduced commercially in the 1990s, is what let it catch up to and eventually overtake established players like Nikon and Canon, and essentially every leading-edge immersion and EUV lithography tool shipped today, regardless of maker, is a scanner rather than a stepper for exactly the lens-correction reason that made scanning win in the first place.

Read step-and-scan through a *correct-a-slit-not-a-field* lens rather than a *faster-exposure* lens — the scanning motion looks like it exists for throughput, but the real reason it exists is that it let lens designers solve a much easier optical problem and still cover a bigger field, which is the trade that actually decided how every modern lithography tool is built.

Take step and scan further

Ask the copilot about this term, or have our engineers assess it against your process.