Atomic Layer Etching (ALE) is the technique that removes material one atomic layer at a time using self-limiting surface reactions — providing angstrom-level precision for critical patterning at advanced technology nodes where conventional reactive ion etching lacks the control needed for sub-5nm feature dimensions.
How ALE Works
Two-Step Cycle:
- Step 1 — Modification: Reactive gas (Cl2, BCl3) chemisorbs onto the surface, modifying exactly one atomic layer. Reaction is self-limiting — excess gas does not penetrate deeper.
- Step 2 — Removal: Low-energy ion bombardment (Ar+, typically 10–25 eV) sputters only the modified layer, leaving underlying material intact.
- Purge between steps removes by-products and excess reactants.
- Each cycle removes ~0.3–0.5 angstrom of material.
ALE vs. Conventional Etching
| Parameter | RIE/Plasma Etch | Atomic Layer Etch |
|---|---|---|
| Control | ~1 nm at best | 0.3–0.5 Å per cycle |
| Damage | Ion bombardment damage | Minimal (low energy ions) |
| Selectivity | Material-dependent | Extremely high (self-limiting) |
| Throughput | Fast (seconds) | Slow (minutes per nm) |
| Uniformity | Limited by plasma uniformity | Inherently uniform |
Types of ALE
- Directional (Anisotropic) ALE: Ion bombardment provides directionality — used for gate trimming, fin thinning.
- Isotropic (Thermal) ALE: Chemical removal without ion bombardment — used for selective material removal in 3D structures like nanosheet inner spacers.
Applications at Advanced Nodes
- FinFET fin width trimming: Sub-nm precision on fin width for Vt control.
- Nanosheet channel thinning: Precise channel thickness control.
- Self-aligned contact etch: Controlled recess without punching through thin etch stops.
- EUV resist trimming: Smoothing line edge roughness by controlled atomic-scale removal.
Atomic layer etching is the etch counterpart to ALD — together they define the atomic-precision processing paradigm that makes sub-3nm transistor fabrication possible.
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