3D NAND Slit Bottom Punch Etch

Slit bottom punch is a short, separate etch run right after the main slit cut, and it exists because stopping a deep trench etch exactly on a thin film is a different, harder problem than cutting the trench itself.

Main slit etch complete
block/sub-block/select-gate cuts done
Thin film remains
oxide/ONO above the source plate
Bottom punch etch
short, controlled, separate chemistry
Source-line plate exposed
through the slit, from above
Replacement gate + CSL next
both depend on this opening

The main slit etch is deliberately left incomplete by a few nanometers, on purpose, so this punch can finish the job with its own tuned chemistry.

Slit Bottom Punch — the Last Few Nanometers of the Slit Etch a short, separate etch that finishes what the main slit etch could not safely do on its own array stack, full slit depth already cut above this point main slit etch stops just above the plate thin oxide/ONO film left — punch target bottom punch opens here source-line plate — now reachable from the slit Why not just over-etch the main slit over-etching risks damaging the source-line plate itself, or punching too far through a separate, controlled punch stops at exactly the right film, using a chemistry tuned for this last thin layer only A short etch that gates two modules downstream neither replacement gate's wet chemistry nor the CSL contact fill can reach the source-line plate until this punch opens the last thin film standing between the slit and the plate underneath it. opens the same plate the channel-hole bottom punch reaches from above — two separate punches, two different directions, one target

The main slit etch stops just short of the source-line plate, not because the etch cannot go deeper, but because it should not. A single continuous etch run all the way to the plate risks either stopping early, leaving blocking film in place, or over-etching and damaging the plate itself — so the main cut is tuned to clear the bulk of the trench and deliberately leaves a thin oxide or ONO film in place as a safety margin.

The punch etch then removes exactly that thin remaining film, with chemistry suited to it rather than to the bulk oxide above it. Because the target here is thin and the plate underneath is not meant to be touched, this etch runs with tighter control and different selectivity than the trench etch that preceded it — a short step, but one with very little room for error in either direction.

Two modules downstream cannot start without this punch. Replacement gate's wet pull-back chemistry and the CSL contact fill both reach the source-line plate exclusively through the slit, which means neither one has a usable path into the array until the bottom punch finishes opening that last film.

This is the slit's version of the same problem the channel hole etch solves from above. The channel-hole bottom punch opens the ONO film at the base of each hole so the channel reaches the source plate vertically; the slit bottom punch opens the last film at the base of the trench so the slit reaches the same plate from the side — two separate punches, cut from two different directions, converging on one shared target.

Slit bottom punch is proof that the hardest part of an etch is sometimes not depth or aspect ratio but precision at the very end of a cut: the main slit trench across Samsung's V-NAND, SK hynix's 4D NAND, Kioxia/WD's BiCS, Micron, and YMTC's Xtacking all leave this last film deliberately uncut, because finishing it separately is safer than trying to land the whole trench in one continuous pass.

Take 3d nand slit bottom punch etch further

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