static noise analysis

**Static Noise Analysis (SNA)** is the **technique for verifying that noise on internal chip signals does not cause functional failures** — analyzing whether signal disturbances from coupling crosstalk, power supply noise, and leakage currents can generate glitches that propagate through combinational logic to reach and corrupt flip-flop inputs, potentially causing the chip to produce wrong results. **Noise Sources on Chip** | Source | Mechanism | Magnitude | |--------|----------|----------| | Capacitive crosstalk | Adjacent wire switching couples noise | 50-200 mV | | Power supply noise | IR drop and L di/dt | 30-100 mV | | Leakage current | Off-state transistors inject current on quiet wire | 10-50 mV | | Charge sharing | Parasitic capacitance redistribution | 20-100 mV | | Miller coupling | Gate-drain capacitance of driving transistor | 20-80 mV | **How Noise Causes Failures** 1. **Aggressor** wire switches → coupled noise appears on **victim** wire. 2. Noise pulse enters combinational logic gates. 3. Each gate either **attenuates** the noise (below switching threshold) or **propagates** it. 4. If noise reaches a flip-flop setup/hold window → wrong value captured → functional failure. **Static Noise Analysis Flow** 1. **Extract parasitics**: Coupling capacitances between all wire pairs. 2. **Compute noise**: For each net, calculate worst-case noise from all aggressors. 3. **Propagate through logic**: Model each gate's noise rejection/propagation. 4. **Check at flip-flops**: Compare noise amplitude at FF input to noise margin. 5. **Report violations**: Nets where noise exceeds margin → potential functional failure. **Noise Metrics** - **DC Noise Margin (NM)**: $NM_H = V_{OH} - V_{IH}$, $NM_L = V_{IL} - V_{OL}$. - **Dynamic noise immunity**: How wide a pulse a gate can absorb without propagating. - **Noise bump**: Maximum voltage disturbance at each net due to coupling. - **Propagated noise**: Noise amplitude after passing through logic gates. **Timing vs. Noise** - **SI-aware STA**: Crosstalk DELAYS timing (speeds up or slows down transition) → checked in STA. - **SNA**: Crosstalk creates GLITCHES on quiet nets → checked in noise analysis. - Both analyses needed: Same physical coupling causes both effects. **Noise Prevention** - **Wire spacing**: Increase space between sensitive nets and aggressors. - **Shielding**: Route ground wires between critical signal pairs. - **Net ordering**: Route same-direction (same timing) nets adjacent — reduce relative switching. - **Buffer insertion**: Buffers on long nets reduce noise accumulation. - **NDR (Non-Default Rules)**: Critical nets routed with wider spacing. Static noise analysis is **an essential signoff check for high-reliability chips** — a noise-induced glitch that causes a single bit flip in a processor can corrupt data, crash a system, or cause a safety-critical failure, making systematic noise verification as important as timing verification for chip correctness.

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