x-13-arima-seats, time series models
X-13-ARIMA-SEATS combines seasonal adjustment with ARIMA modeling for economic time series analysis.
32 technical terms and definitions
X-13-ARIMA-SEATS combines seasonal adjustment with ARIMA modeling for economic time series analysis.
Mean and range charts.
Mean and standard deviation.
General-purpose segmentation and caption model.
X-masking prevents unknowns from corrupting signature analysis in BIST.
X-propagation tracks unknown value propagation through logic.
Study electronic structure and bonding.
Map elemental composition.
See internal solder joints.
X-ray laminography produces cross-sectional images at specific depths revealing internal package structures.
Surface chemical analysis.
Spatially-resolved XPS.
Measure thickness density roughness.
Use X-rays for CD measurement.
X-ray computed tomography creates 3D reconstructions of package structures revealing internal defects like voids and cracks non-destructively.
X-state handling manages unknown values in simulation and test preventing masking.
Efficient 3D network family.
Chemical state and local structure.
Initialize considering fan-in and fan-out.
Extreme Deep Factorization Machine combines compressed interaction network with deep networks for feature interactions.
Xenon Focused Ion Beam uses heavier ions than gallium for rapid material removal in failure analysis with reduced redeposition.
XGBoost is popular regularized boosting. Many competition wins.
TensorFlow's optimizing compiler.
Accelerated Linear Algebra compiler optimizes TensorFlow computations through domain-specific compilation.
XLA compiles TensorFlow/JAX for accelerators. Whole-graph optimization. Used for TPU compilation.
Learn from all permutations of sequence.
Permutation-based language model that captures bidirectional context.
Cross-lingual NLI.
Efficient binary convolution using XNOR.
Position encoding that extrapolates to longer sequences.
Analyze crystal structure and film stress using x-ray diffraction.
Measure elemental composition and film thickness via x-ray fluorescence.