lot number, manufacturing operations
Lot numbers identify groups of wafers processed together for traceability.
442 technical terms and definitions
Lot numbers identify groups of wafers processed together for traceability.
Batch identification.
Lot sizing determines optimal production or order quantities balancing setup costs and inventory.
Divide lots for parallel processing.
Monitor wafer lot location.
Group of wafers processed together as a batch.
Lottery ticket hypothesis posits that dense networks contain sparse subnetworks trainable to full accuracy.
Sparse subnetworks that train from scratch.
Lottery ticket hypothesis: sparse subnetworks train to full accuracy. Find winning ticket through pruning.
Fast community detection method.
Surface crystal structure.
More deterministic generation.
Small misorientation between grains.
Low-k dielectrics reduce inter-metal capacitance and RC delay by using materials with lower permittivity than silicon dioxide.
Insulator with low dielectric constant to reduce capacitance and RC delay.
Insulator with low k for reduced capacitance.
Different loop profiles.
Use FP16 or BF16 for training.
Thinner QFP.
Low-rank factorization decomposes weight matrices into products of smaller matrices.
Efficient tensor fusion.
Translate with limited data.
Gentle moisture removal.
Lower boundary for normal variation.
Minimum acceptable value.
Convert to lowercase.
Bound perturbations in Lp norm.
LPCNet combines linear prediction with neural vocoding for efficient high-quality speech generation.
CVD at reduced pressure for better uniformity and step coverage.
Perceptual distance metric.
Evict least recently used items when full.
Least Recently Used cache evicts oldest accessed entries maintaining frequently used items.
Locality Sensitive Hashing creates hash functions preserving similarity for approximate search.
LSTM-based anomaly detection flags time steps with high prediction error or unusual hidden states.
LSTM-VAE combines variational autoencoders with LSTM networks to detect anomalies in sequential data through reconstruction probability thresholds.
Long- and Short-term Time-series Network combines CNNs and RNNs with skip connections for multivariate forecasting.
Initialize to unit variance per layer.
Lot Tolerance Percent Defective is worst quality level acceptable to consumer.
Light-weight and Variable-Context Network for efficient high-quality neural vocoding on mobile devices.
Laser Voltage Imaging spatially maps voltage distributions across die surface revealing shorts or voltage drops.
Verify layout matches circuit schematic.
Lyapunov functions provide certificates of stability and safety for learned control policies.