bromine-based etch,etch
Use Br chemistry for selective etching (HBr).
9,967 technical terms and definitions
Use Br chemistry for selective etching (HBr).
Browser inference via WebGPU or WASM. No server needed. Limited by device capability. Good for demos.
Brush scrubbers physically contact wafers removing particles through mechanical action.
Physical brushes + chemicals to remove stubborn particles.
Bayesian Structural Time Series models time series through state space framework with spike-and-slab priors.
Buffer management sizes and positions inventory protecting throughput from variability.
Protect bottleneck with inventory.
Temporary storage location for wafers inside tool.
HF + NH4F solution to etch oxide with controlled rate.
Identify potential bugs or vulnerabilities in code.
Automated bug detection and fixing. Explain errors, suggest fixes.
Identify location of bugs in code.
Summarize bug descriptions.
Voltage across depletion region.
On-chip structures monitoring aging.
Built-in repair uses on-chip circuitry to autonomously detect faults and activate redundant elements without external intervention.
Central storage and distribution of process gases (N2 O2 Ar H2 NH3 etc).
Bulk gases like nitrogen and argon are stored in large quantities on-site.
Oxygen precipitates and related defects.
Etch into substrate bulk.
Loose components.
Defect in material bulk.
Bull's eye patterns show concentric rings indicating radial process variations.
Combine Krum with trimmed mean.
Optimize camera poses and 3D points jointly.
Bundle recommendations suggest sets of complementary items rather than individual items.
Buried contacts directly connect polysilicon gates to diffusion regions without vias reducing resistance.
Heavily doped layer beneath devices.
Oxide layer in SOI structure.
Embed power rails below transistors.
Power delivery from backside or buried layers.
Test fixture for burn-in.
Minimize time while catching defects.
Optimize burn-in to catch early failures.
Temperature-controlled chamber.
Accelerate early failures before shipping.
Connect devices during burn-in.
Burn-in accelerates infant mortality through elevated temperature and voltage stress.
High-temperature operation to screen early failures.
Detailed screening processes for early failures.
Burn-in yield measures the percentage of devices surviving accelerated stress testing revealing infant mortality and latent defects.
Accelerated stress testing to weed out early failures.
Burn is Rust deep learning framework. Multiple backends. Type-safe.
Butterfly valves regulate flow through rotating disc elements.
Operate on bytes not characters.
Tokenize at byte level to handle any Unicode without vocabulary limits.
Handle malicious participants.
Count of defects.
C-mode Scanning Acoustic Microscopy detects delamination and voids through ultrasonic reflections at material interfaces.
C-mode acoustic microscopy.