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6 technical terms and definitions

All Topics Semiconductor Generative AI
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kelvin contact,metrology

Four-terminal measurement to eliminate probe resistance.

kelvin probe force microscopy (kpfm),kelvin probe force microscopy,kpfm,metrology

Measure work function and surface potential.

kelvin probe, metrology

Non-contact work function measurement.

killer defect size,metrology

Minimum size that causes failures.

known good die for chiplets, kgd, advanced packaging

Pre-tested dies for multi-die packages.

krf (krypton fluoride),krf,krypton fluoride,lithography

248nm DUV light source.